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fast-experiments

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Use when designing or auditing a USENIX FAST storage evaluation, covering real devices and firmware, device-state control (aging, preconditioning, fill, TRIM), standard workloads and traces (SNIA IOTTA, YCSB, filebench, fio), write amplification, tail latency, endurance and wear, crash-consistency testing, fair baselines, and matching the metric to the shape of each storage claim.

When to use

• designing USENIX FAST storage evaluation
• auditing storage evaluation
• controlling device state (aging, preconditioning, fill, TRIM)
• using standard workloads and traces (SNIA IOTTA, YCSB, filebench, fio)
• measuring write amplification and tail latency
• testing endurance, wear, and crash-consistency
• selecting fair baselines
• matching metrics to storage claims

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